- All sections
- G - Physics
- G01J - Measurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light; colorimetry; radiation pyrometry
- G01J 1/18 - Photometry, e.g. photographic exposure meter by comparison with reference light or electric value using electric radiation detectors using comparison with a reference electric value
Patent holdings for IPC class G01J 1/18
Total number of patents in this class: 144
10-year publication summary
|
15
|
10
|
14
|
17
|
14
|
7
|
11
|
13
|
6
|
0
|
| 2015 | 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Samsung Electronics Co., Ltd. | 131630 |
8 |
| Semiconductor Components Industries, L.L.C. | 5345 |
4 |
| Enphase Energy, Inc. | 554 |
4 |
| STMicroelectronics International N.V. | 1484 |
4 |
| Ricoh Company, Ltd. | 13266 |
3 |
| ams AG | 807 |
3 |
| ams International AG | 399 |
3 |
| UT-Battelle, LLC | 1333 |
3 |
| Axon Enterprise, Inc. | 670 |
3 |
| Solar Light Company, LLC | 30 |
3 |
| General Electric Company | 18133 |
2 |
| International Business Machines Corporation | 60644 |
2 |
| Honeywell International Inc. | 13799 |
2 |
| Microsoft Technology Licensing, LLC | 51439 |
2 |
| Omron Corporation | 6968 |
2 |
| Fitbit, Inc. | 663 |
2 |
| National Research Council of Canada | 1545 |
2 |
| Radisens Diagnostics Limited | 16 |
2 |
| Seek Thermal, Inc. | 91 |
2 |
| Universidad Complutense de Madrid | 201 |
2 |
| Other owners | 86 |